RFID Journal Teams With ISCEA To Offer Supply Chain Education At RFID Journal LIVE! 2008
RFID Journal, the world's leading media and events company covering radio frequency identification (RFID) technology, announced recently that it has partnered with the International Supply Chain Education Alliance (ISCEA) to offer a preconference training seminar, "Going Physical Free," at RFID Journal LIVE! 2008, RFID Journal's sixth annual conference and exhibition, being held April 16-18 at the Venetian Hotel in Las Vegas.
The focus of the seminar is to help participants to define inventory record accuracy in terms of the benefits and costs that are important for their organization. They will also learn to establish an effective cycle-counting process that will improve inventory record accuracy, conduct effective root-cause analysis so they can find and fix the issues that lead to poor performance, and build a business case and an implementation plan to eliminate physical inventories. Participants will get an understanding of the implications of RFID technology on inventory record accuracy and cycle-counting processes.
"We're very pleased to be working with the ISCEA to bring a new type of education to our event," said Mark Roberti, founder and editor of RFID Journal. "Our attendees want to understand how RFID fits in with best practices, such as those elucidated in the ISCEA, so I firmly believe they will find this addition to the program extremely valuable.
The International Supply Chain Education Alliance conducts many workshops worldwide to improve the knowledge of manufacturing and service industry professionals. Its mission is to be the single source for Total Supply Chain Knowledge through education, certification, and recognition. ISCEA instructors are University Professors or Managers of Major Corporations in the USA with more than five years of work experience.
"We are pleased to be working with RFID Journal to bring one of our most popular programs to RFID Journal LIVE! 2008, the world's premier RFID event," says Dr. Charles A. Watts, Executive Director of Education & Certification Programs at ISCEA. "This is an opportunity to put RFID technology in the context of supply chain best practices."
RFID Journal LIVE! 2008 will feature eight educational tracks customized for those with different levels of knowledge of RFID—from beginner to experienced user—and is targeted to those interested in understanding how RFID can deliver real benefits in the Aerospace/Defense, Manufacturing, Retail/Consumer Packaged Goods, Pharmaceutical, and Supply Chain/Logistics industries.
The event also features 10 preconference seminars aimed at specific industries and audience needs. There will be three co-located events: EPCglobal's Joint Action Group Meeting, IEEE RFID 2008, and a Sam's Club Supplier's Meeting.
In addition, RFID Journal LIVE! 2008 will feature more than 175 leading technology providers exhibiting in the 100,000-square-foot exhibit hall. The exhibit hall will showcase live demonstration centers and, for the first time ever, technology companies that will compete for a new Best in Show Award, to be determined by a panel of judges with input from attendees.
RFID Journal LIVE! is the largest and most important RFID event in the world. More than 2,500 people attended the 2007 event, including most leading early adopters and pioneers of the technology. For more information about RFID Journal LIVE! 2008, visit www.rfidjournalevents.com/live/.
About RFID Journal
RFID Journal is the leading source of news and in-depth information about radio frequency identification (RFID) and its many business applications. Business executives and implementers depend on RFID Journal for up-to-the-minute RFID news, in-depth case studies, best practices, strategic insights, and information about vendor solutions. This has made RFID Journal the most relied-upon and respected RFID information resource, serving the largest audience of RFID decision-makers worldwide in print, online and at face-to-face events. For more information, visit www.rfidjournal.com.
SOURCE: RFID Journal